Atomic force microscopy combined with optical tweezers (AFM/OT)

Author： Pierini F   Zembrzycki K   Nakielski P   Pawłowska S   Kowalewski T A  

Publisher： IOP Publishing

E-ISSN： 1361-6501|27|2|25904-25914

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.27, Iss.2, 2016-02, pp. : 25904-25914

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