Exact modeling of finite temperature and quantum delocalization effects on reliability of quantum-dot cellular automata

Author： Tiihonen Juha Schramm Andreas Kylänpää Ilkka Rantala Tapio T

E-ISSN： 1361-6463|49|6|65103-65109

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.49, Iss.6, 2016-02, pp. : 65103-65109

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