Theoretical study of defect impact on two-dimensional MoS₂

Author： Krivosheeva Anna V. Shaposhnikov Victor L. Borisenko Victor E. Lazzari Jean-Louis Waileong Chow Gusakova Julia Krivosheeva Anna V.

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.36, Iss.12, 2015-12, pp. : 122002-122007

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