Rare events – a probability approach or an ill-posed problem?

Author: Osterloh K   Jaenisch G-R  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.58, Iss.1, 2016-01, pp. : 46-51

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Abstract