A spatial random field model to characterize complexity in earthquake slip

Publisher: John Wiley & Sons Inc

E-ISSN: 2156-2202|107|B11|ESE 10-1-ESE 10-21

ISSN: 0148-0227

Source: Journal Of Geophysical Research, Vol.107, Iss.B11, 2002-11, pp. : ESE 10-1-ESE 10-21

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