K-Shell X-Ray Fluorescence Studies of Some Elements in the Atomic Number Range 26 = Z = 70

Publisher： IGI Global_journal

E-ISSN： 2155-4129|3|2|27-44

ISSN： 2155-4110

Source： International Journal of Chemoinformatics and Chemical Engineering (IJCCE), Vol.3, Iss.2, 2013-07, pp. : 27-44

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Some studies on the influence of stress ratio and test temperature on X-ray fractography observations in C45 steel specimens

By Koszer S.   Moshe S.L.   Legatt A.D.   Shinnar S.   Goldensohn E.S.   Rajanna K.   Pathiraj B.   Kolster B.H.  

Engineering Fracture Mechanics, Vol. 54, Iss. 4, 1996-07 ,pp. : 457-470

Elsevier

Access to resources Recommend Favorite

Micro-Raman spectroscopy and X-ray diffraction studies of atomic-layer-deposited ZrO2 and HfO2 thin films

By Tkachev S.   Manghnani M.   Niilisk A.   Aarik J.   Mändar H.  

Journal of Materials Science, Vol. 40, Iss. 16, 2005-08 ,pp. : 4293-4298

Springer Publishing Company

Access to resources Recommend Favorite

X-ray Fractography studies on austenitic stainless steels

By Rajanna K.   Pathiraj B.   Kolster B.H.  

Engineering Fracture Mechanics, Vol. 54, Iss. 1, 1996-05 ,pp. : 155-166

Elsevier

Access to resources Recommend Favorite

Sensitivity of HEMATEG Induced by Radiation Dose in the Diagnostic X-Ray Energy Range

By  

Advanced Materials Research, Vol. 2015, Iss. 1087, 2015-03 ,pp. : 267-271

Trans Tech Publications

Access to resources Recommend Favorite

X-ray line broadening and photoelectrochemical studies on CdSe thin films

By Thanikaikarasan S.   Shajan X.   Dhanasekaran V.   Mahalingam T.  

Journal of Materials Science, Vol. 46, Iss. 11, 2011-06 ,pp. : 4034-4045

Springer Publishing Company

Access to resources Recommend Favorite