Dynamic Semi-Group Model for Reliability Engineering Optimizing the Risk on RTOS

Publisher： IGI Global_journal

E-ISSN： 1947-3109|5|3|48-61

ISSN： 1947-3095

Source： International Journal of Strategic Information Technology and Applications (IJSITA), Vol.5, Iss.3, 2014-07, pp. : 48-61

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