Publisher： Trans Tech Publications
E-ISSN： 1662-8985|2015|1131|16-19
ISSN： 1022-6680
Source： Advanced Materials Research, Vol.2015, Iss.1131, 2016-01, pp. : 16-19
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Abstract
The GaAs nanowires are grown on Si (111) substrates by Ga-assisted molecular beam epitaxy growth technique. The effect of SiO2 thickness on the structural properties of GaAs nanowires is investigated by Scanning Electron Microscope (SEM). The nucleation of GaAs nanowires related to the presence of a SiO2 layer previously coated on Si substrate. The results show that the density, length, and diameter of GaAs nanowires strongly depend on the oxidation time (or SiO2 thickness).
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