Application of a cavity perturbation method to the measurement of the complex microwave impedance of thin super- or normal conducting films

Publisher： Edp Sciences

E-ISSN： 1286-4897|4|5|917-927

ISSN： 1155-4320

Source： Journal de Physique III, Vol.4, Iss.5, 1994-05, pp. : 917-927

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