Caractérisation électrique non destructive de couches semiconductrices par mesures d'effet Hall en hyperfréquences

Publisher: Edp Sciences

E-ISSN: 1286-4897|2|5|805-819

ISSN: 1155-4320

Source: Journal de Physique III, Vol.2, Iss.5, 1992-05, pp. : 805-819

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