Applications of Laser Techniques to Field Ion Microscopy

E-ISSN： 1764-7177|06|C5|C5-15-C5-24

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.06, Iss.C5, 1996-09, pp. : C5-15-C5-24

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Helium ion microscopy and energy selective scanning electron microscopy – two advanced microscopy techniques with complementary applications

Journal of Physics: Conference Series , Vol. 522, Iss. 1, 2014-06 ,pp. : 219-222

IOP Publishing

Access to resources Recommend Favorite

Atom-Probe Field-Ion Microscopy Investigation of CMSX-4 Ni-Base Superalloy Laser Beam Welds

Le Journal de Physique IV, Vol. 06, Iss. C5, 1996-09 ,pp. : C5-253-C5-258

Edp Sciences

Access to resources Recommend Favorite

NEGATIVE ION IMAGING IN FIELD ION MICROSCOPY

Le Journal de Physique Colloques, Vol. 47, Iss. C7, 1986-11 ,pp. : C7-53-C7-57

Edp Sciences

Access to resources Recommend Favorite

Field ion microscopy of objects on a micron scale

By Ksenofontov V. Sadanov E. Mikhailovskij I. Velikodnaya O.

Technical Physics Letters, Vol. 31, Iss. 10, 2005-10 ,pp. : 891-893

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

COMPUTERIZED IMAGING SYSTEM FOR FIELD ION MICROSCOPY

Le Journal de Physique Colloques, Vol. 47, Iss. C2, 1986-03 ,pp. : C2-479-C2-484

Edp Sciences

Access to resources Recommend Favorite