Nano-Localized Thermal Analysis and Mapping of Surface and Sub-Surface Thermal Properties Using Scanning Thermal Microscopy (SThM)

Publisher: Cambridge University Press

E-ISSN: 1435-8115|22|6|1270-1280

ISSN: 1431-9276

Source: Microscopy and Microanalysis, Vol.22, Iss.6, 2016-11, pp. : 1270-1280

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content