Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines

Publisher: Cambridge University Press

E-ISSN: 1435-8115|22|6|1233-1243

ISSN: 1431-9276

Source: Microscopy and Microanalysis, Vol.22, Iss.6, 2016-10, pp. : 1233-1243

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract