Author: Yong Yongliang Lv Shijie Li Xiaohong Li Tongwei Cui Hongling
Publisher: Edp Sciences
E-ISSN: 1286-4854|111|1|10006-10006
ISSN: 0295-5075
Source: EPL (EUROPHYSICS LETTERS), Vol.111, Iss.1, 2015-07, pp. : 10006-10006
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering
Le Journal de Physique IV, Vol. 04, Iss. C9, 1994-11 ,pp. :
New development in high resolving power W-Si calorimeters
Journal of Physics: Conference Series , Vol. 293, Iss. 1, 2011-04 ,pp. :
Prediction of phase equilibria in the W-Si system in the generalized lattice model
Journal of Physics: Conference Series , Vol. 541, Iss. 1, 2014-10 ,pp. :