Observation of thermally activated glassiness and memory dip in a-NbSi insulating thin films

Author: Delahaye J.   Grenet T.   Marrache-Kikuchi C. A.   Drillien A. A.   Bergé L.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|106|6|67006-67006

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.106, Iss.6, 2014-06, pp. : 67006-67006

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Abstract