Expanding the measurement range of a critical-angle refractometer through Fourier analysis

Author: Ye Junwei   Xia Min   Liu Hao   Li Wei   Guo Wenping   Xiong Changxin   Yang Kecheng  

Publisher: Edp Sciences

E-ISSN: 1286-4854|104|2|20001-20001

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.104, Iss.2, 2013-11, pp. : 20001-20001

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Abstract