Barkhausen-type noise in the resistance of antiferromagnetic Cr thin films

Author： Tosi L.   Osquiguil E.   Kaul E. E.   Balseiro C. A.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|100|6|67005-67005

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.100, Iss.6, 2013-01, pp. : 67005-67005

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