Quantitative analysis of the order of Bi ion induced dot patterns on Ge

Author： Böttger R.   Bischoff L.   Facsko S.   Schmidt B.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|98|1|16009-16009

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.98, Iss.1, 2012-04, pp. : 16009-16009

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