Protecting clean critical points by local disorder correlations

Author: Hoyos J. A.   Laflorencie N.   Vieira A. P.   Vojta T.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|93|3|30004-30004

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.93, Iss.3, 2011-02, pp. : 30004-30004

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Abstract