Correlation between coercive tip bias and domain wall width evolution, and tunable mechanism transition in ferroelectric films

Author： Shi Y. P.   Soh A. K.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|92|5|57006-57006

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.92, Iss.5, 2010-12, pp. : 57006-57006

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