Doped silicene: Evidence of a wide stability range

Author: Cheng Y. C.   Zhu Z. Y.   Schwingenschlögl U.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|95|1|17005-17005

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.95, Iss.1, 2011-06, pp. : 17005-17005

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Abstract