Imaging in scanning tunneling microscopyand its relationship with surface roughness

Author： Aguilar M.   Oliva A. I.   Anguiano E.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|46|4|442-447

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.46, Iss.4, 2010-03, pp. : 442-447

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