

Author: Siffalovic P. Drescher M. Heinzmann U.
Publisher: Edp Sciences
E-ISSN: 1286-4854|60|6|924-930
ISSN: 0295-5075
Source: EPL (EUROPHYSICS LETTERS), Vol.60, Iss.6, 2010-03, pp. : 924-930
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Abstract
Visible-pump/extreme ultraviolet (EUV)-probe spectroscopy usingspectrally selected high harmonics of intense laser pulses isutilised for tracking the charge carrier dynamics onsemiconductor surfaces. The time evolution of the electric fieldin the surface layer of
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