Oxygen diffusion in off–c-axis normal-state $\textmd{Bi}_2\textmd{Sr}_2\textmd{CaCu}_2\textmd{O}_{8+\delta}$ films

Author: Gramm A.   Zahner Th.   Spreitzer U.   Rössler R.   Pedarnig J. D.   Bäuerle D.   Lengfellner H.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|49|4|501-506

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.49, Iss.4, 2010-03, pp. : 501-506

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Abstract

The anisotropy of the oxygen diffusion in the high-Tc-super con duc tor Bi2Sr2CaCu2O$_{8+\delta}$ was investigated using off–c-axis prepared thin films. High-quality oriented films with thickness 1000 Å and c-axis inclined by a tilt angle α with respect to the normal of the film surface were grown up to $\alpha = 15^\circ$. Oxygen diffusion following a small change of the ambient oxygen partial pressure in the temperature range $200\mbox{--}400\un{^\circ C}$ was monitored by in situ resistance measurements. Diffusion times according to an activated process $\tau^{-1}=\tau_0^{-1}\exp[-E/k_{\rm B}T]$ were found, with E = 0.6 eV and $\tau_0 = \tau_0(\alpha)$ becoming smaller with increasing tilt angle. A comparison of the experimental $\tau_0(\alpha)$ with a calculation of $\tau_0$ for an ideal monocrystalline film suggests that as-grown films consist of crystalline grains with la te ral dimensions $\sim 1\un{\mu m}$.

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