Observation of the Huygens-principle growth mechanismin sputtered W/Si multilayers

Author: Salditt T.   Lott D.   Metzger T. H.   Peisl J.   Fischer R.   Zweck J.   Høghøj P.   Schärpf O.   Vignaud G.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|36|8|565-570

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.36, Iss.8, 2010-03, pp. : 565-570

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Abstract