Atomic mapping of structural distortions in 109° domain patterned BiFeO3 thin films

Publisher: Cambridge University Press

E-ISSN: 2044-5326|32|12|2423-2430

ISSN: 0884-2914

Source: Journal of Materials Research, Vol.32, Iss.12, 2017-06, pp. : 2423-2430

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Abstract