Obtaining optimal structural data from X-ray powder diffraction using the Rietveld method — CORRIGENDUM

Publisher: Cambridge University Press

E-ISSN: 1945-7413|32|2|156-156

ISSN: 0885-7156

Source: Powder Diffraction, Vol.32, Iss.2, 2017-05, pp. : 156-156

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next