In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|4|751-757

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.4, 2017-08, pp. : 751-757

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