Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

Publisher: Cambridge University Press

E-ISSN: 2150-3583|25|5|36-45

ISSN: 1551-9295

Source: Microscopy Today, Vol.25, Iss.5, 2017-08, pp. : 36-45

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