X‐ray Diffraction and Rietveld Refinement in Deferrified Clays for Forensic Science

Publisher: John Wiley & Sons Inc

E-ISSN: 1556-4029|63|1|251-257

ISSN: 0022-1198

Source: JOURNAL OF FORENSIC SCIENCES, Vol.63, Iss.1, 2018-01, pp. : 251-257

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract