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Taylor & Francis Ltd

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New pathways for improved quantification of energy‐dispersive X‐ray spectra of semiconductors with multiple X‐ray lines from thin foils investigated in transmission electron microscopy

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John Wiley & Sons Inc

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Low-cost virtual instrumentation system of an energy-dispersive X-ray spectrometer for a scanning electron microscope

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Journal of Automated Methods & Management in Chemistry, Vol. 24, Iss. 4, 2002-07 ,pp. : 121-125

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The study of Al₃(Mn, Pd) crystal and Al–Mn–Pd decagonal quasicrystal by spherical aberration-corrected scanning transmission microscopy and atomic-resolution energy dispersive X-ray spectroscopy

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Transmission electron microscopy-energy-dispersive X-ray spectroscopy analysis of the modulated structure in ZrO-6 mol% Y O alloy 2 2 3

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