Spice model for detection of dynamic threshold voltage shift during failure analysis of oxide TFT‐based AMD gate drivers

Publisher： John Wiley & Sons Inc

E-ISSN： 1938-3657|25|11|663-671

ISSN： 1071-0922

Source： JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, Vol.25, Iss.11, 2017-11, pp. : 663-671

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