Optical characterisation of BiFeO3 epitaxial thin films grown by pulsed‐laser deposition

Publisher: John Wiley & Sons Inc

E-ISSN: 1610-1642|7|2|296-299

ISSN: 1862-6351

Source: PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.7, Iss.2, 2010-02, pp. : 296-299

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract