通过电子皮镜观察到在后天性痣亚型中常见 BRAF 和 NRAS 突变,表现出组成型 MAPK 通路活化

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2133|178|1|e102-e102

ISSN: 0007-0963

Source: BRITISH JOURNAL OF DERMATOLOGY, Vol.178, Iss.1, 2018-01, pp. : e102-e102

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Abstract