Risk Factors and Prognosis of Atrioventricular Block After Atrial Septum Defect Closure Using the Amplatzer Device

Author: Wang Yibin   Hua Yimin   Li Li   Wang Xiaoqin   Qiao Lina   Shi Xiaoqing   Hua Jiping   Qu Yi   Mu Dezhi  

Publisher: Springer Publishing Company

ISSN: 0172-0643

Source: Pediatric Cardiology, Vol.35, Iss.3, 2014-03, pp. : 550-555

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