Polytype distribution of circumstellar silicon carbide - microstructural characterization by transmission electron microscopy

Author: Daulton T.L.   Bernatowicz T.J.   Lewis R.S.   Messenger S.   Stadermann F.J.   Amari S.  

Publisher: Elsevier

ISSN: 0016-7037

Source: Geochimica et Cosmochimica Acta, Vol.67, Iss.24, 2003-12, pp. : 4743-4767

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