Author: Shaltout Abdallah
Publisher: Springer Publishing Company
ISSN: 0021-9037
Source: Journal of Applied Spectroscopy, Vol.78, Iss.4, 2011-09, pp. : 594-600
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quantitative Analysis Using Scattered Radiation with WDXRF
By Demir D.
Instrumentation Science & Technology, Vol. 35, Iss. 6, 2007-11 ,pp. :