Electron beam-induced mass transport in As-Se thin films: compositional dependence and glass network topological effects

Author： Trunov M.L. Cserháti C. Lytvyn P.M. Kaganovskii Yu Kökényesi S.

Publisher： IOP Publishing

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.46, Iss.24, 2013-06, pp. : 245303-245311

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