A finite element analysis of surface-stress effects on measurement of the Si lattice parameter

Author: Quagliotti D.   Mana G.   Massa E.   Sasso C.   Kuetgens U.  

Publisher: IOP Publishing

ISSN: 0026-1394

Source: Metrologia, Vol.50, Iss.3, 2013-06, pp. : 243-248

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Abstract