Electron lifetimes in image-potential states at metal-dielectric interfaces

Author： Machado M. Chulkov E.V. Silkin V.M. Hofer U. Echenique P.M.

Publisher： Elsevier

ISSN： 0079-6816

Source： Progress in Surface Science, Vol.74, Iss.1, 2003-12, pp. : 219-237

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