Radiation hardness of Czochralski silicon, Float Zone silicon and oxygenated Float Zone silicon studied by low energy protons

Author: Harkonen J.   Tuovinen E.   Luukka P.   Tuominen E.   Lassila-Perini K.   Mehtala P.   Nummela S.   Nysten J.   Zibellini A.   Li Z.   Fretwurst E.   Lindstroem G.   Stahl J.   Honniger F.   Eremin V.   Ivanov A.   Verbitskaya E.   Heikkila P.   Ovchinnikov V.   Yli-Koski M.   Laitinen P.   Pirojenko A.   Riihimaki I.   Virtanen A.  

Publisher: Elsevier

ISSN: 0168-9002

Source: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol.518, Iss.1, 2004-02, pp. : 346-348

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