Probing nanoscale surface enhanced Raman-scattering fluctuation dynamics using correlated AFM and confocal ultramicroscopy

Author： Suh Y.D.   Schenter G.K.   Zhu L.   Lu H.P.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.97, Iss.1, 2003-10, pp. : 89-102

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