Author: Barragán Manuel
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.27, Iss.3, 2011-06, pp. : 277-288
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
CMOS blocks for on-chip RF test
Analog Integrated Circuits and Signal Processing, Vol. 49, Iss. 2, 2006-11 ,pp. :
An expandable on-chip BP learning neural network chip
By Lu Chun Shi Bingxue Chen Lu
International Journal of Electronics, Vol. 90, Iss. 5, 2003-05 ,pp. :