Structural and gas response characterization of nano-size SnO 2 films deposited by SILD method

Author： Korotcenkov G. Macsanov V. Tolstoy V. Brinzari V. Schwank J. Faglia G.

Publisher： Elsevier

ISSN： 0925-4005

Source： Sensors and Actuators B: Chemical, Vol.96, Iss.3, 2003-12, pp. : 602-609

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