Analysis of indentation size effect (ISE) behavior in low-load Vickers microhardness testing of (Sm123) 1−x (Nd123) x superconductor system

Author： Celik S.

Publisher： Springer Publishing Company

ISSN： 0957-4522

Source： Journal of Materials Science: Materials in Electronics, Vol.24, Iss.7, 2013-07, pp. : 2218-2227

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