Determination of conduction band edge characteristics of strained Si/Si 1-x Ge x

Author: Jian-Jun Song   He-Ming Zhang   Hui-Yong Hu   Xian-Ying Dai   Rong-Xi Xuan  

Publisher: IOP Publishing

ISSN: 1009-1963

Source: Chinese Physics, Vol.16, Iss.12, 2007-12, pp. : 3827-3831

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Abstract