Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology

Author： Dong-Mei Li   Zhi-Hua Wang   Li-Ying Huangfu   Qiu-Jing Gou  

Publisher： IOP Publishing

ISSN： 1009-1963

Source： Chinese Physics, Vol.16, Iss.12, 2007-12, pp. : 3760-3765

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