Author: Neimark Yu. Teklina L.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1054-6618
Source: Pattern Recognition and Image Analysis, Vol.21, Iss.2, 2011-06, pp. : 195-198
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract