Author： Nadtochiy A. Hofmann W. Germann T. Blokhin S. Karachinskiy L. Maximov M. Shchukin V. Zhukov A. Bimberg D.
Publisher： MAIK Nauka/Interperiodica
ISSN： 1063-7826
Source： Semiconductors, Vol.47, Iss.5, 2013-05, pp. : 695-700
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