Author: Nan Ruihua
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.41, Iss.11, 2012-11, pp. : 3044-3049
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Evaluation of Zn uniformity in CdZnTe substrates
By Hirano R. Hichiwa A. Maeda H. Yamamoto T.
Journal of Electronic Materials, Vol. 29, Iss. 6, 2000-06 ,pp. :
Critical thickness in the HgCdTe/CdZnTe system
By Berding M. Nix W. Rhiger D. Sen S. Sher A.
Journal of Electronic Materials, Vol. 29, Iss. 6, 2000-06 ,pp. :